New equipment in FIRST: Metricon prism coupler
FIRST-Lab acquired a new optical characterization tool for thin film analysis.
The Metricon prism coupler is a tool to determine refractive index and thickness of a thin film with low refractive index e.g. optical waveguides, polymers or photoresists. It is particularly useful for films with a rough surface which cannot be measured with ellipsometry or reflectivity measurements due to high light scattering. More information are provided on FIRST equipment website.