New equipment: Atomic Force Microscope

FIRST-Lab is proud to announce that the new Atomic Force Microscope (AFM) NX20 from Park Systems is installed, tested and operational. The user trainings will start now.

The new AFM supports user operation with premounted cantilevers. Standard topography modes i.e. non-contac, contact, tapping and phase imaging are available. In addition, there are options for advanced modes for nanomechanics, nanoidentation or electric and magnetic measurements.

Please refer for more details to our equipment webpage.